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Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X

Sinuo Testing Equipment Co. , Limited
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    Buy cheap Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X from wholesalers
     
    Buy cheap Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X from wholesalers
    • Buy cheap Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X from wholesalers
    • Buy cheap Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X from wholesalers
    • Buy cheap Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X from wholesalers
    • Buy cheap Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X from wholesalers

    Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X

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    Brand Name : Sinuo
    Model Number : SN2210-2T
    Certification : Calibration Certificate(Cost Additional )
    Price : Customized
    Payment Terms : T/T
    Supply Ability : 100 sets per month
    Delivery Time : 3 Days
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    Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X


    Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X


    Product information:


    This test probe complies with the requirements of Probe B as specified in IEC 61032 and IEC 60529 IP2X. It features an M6 threaded hole at the end of the handle, allowing it to be connected to a force gauge for precise testing applications.


    Technical parameters:


    Parameters /ModelSN2210-2T
    NameStandard test probe with force
    Joint 130±0.2 (mm)
    Joint 260±0.2 (mm)
    Finger length80±0.2 (mm)
    Fingertip to baffle180±0.2 (mm)
    CylindricalR2±0.05 (mm)
    SphericalS4±0.05 (mm)
    Fingertip cutting bevel angle37o 0 -10’
    Fingertip taper14 o 0 -10’
    Test finger diameterФ12 0 -0.05 (mm)
    A-A Section diameterФ50(mm)
    A-A Section width20±0.2
    Baffle diameterФ75±0.2(mm)
    Baffle thickness5±0.5(mm)
    Built-in Force0-50N force, resolution of 5N
    Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X

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